QTG-X110
11 Gbps Broadband QSFP+ Clock/Trigger Recovery System

The OPTELLENT QTG-X110 is a compact, costeffective clock/trigger recovery system for testing QSFP+ components and systems in R&D and manufacturing environments. The QTG-X110 enables the recovery of a low frequency trigger from any wavelength out of the composite optical output of QSFP+ modules. This enables viewing the QSFP+ data signals on an oscilloscope for eye-diagram analysis and eye-mask testing. It operates between 9.5 and 11 Gb/s and submultiples of this frequency range. The equipment has LEDs to indicate the chosen wavelength and the clock lock status.

Key Features

• Broadband operation
• Built-in wavelength demultiplexer/switch
• Optical data output of chosen wavelength
• Ideal for eye-diagram/eye-mask analysis

Applications

• Testing of optical transceivers, transponders, linecards, and subsystems
• Testing of opto-electronic components and devices (TOSA, ROSA, lasers, etc…)
• Testing of Gb/s ICs, electronic modules, subsystems, and systems
• Serial high-speed backplane and board design

CDR-X110
11 Gbps Optical and Electrical Clock/Data Recovery System

The OPTELLENT CDR-X110 is a cost-effective, easyto-use clock-and-data recovery system for testing components and systems in R&D and manufacturing environments. It incorporates a reference frequency source, electrical and optical input ports and clock recovery circuits in one compact module that operates between 9.5 and 11.5 Gb/s. The CDR-X110 is offered with either preset discrete data rates or with a continuously variable data rate (2kHz step size).

An optional Graphical User Interface enables easy pointand-click operation. The Optellent CDR-X110 software runs on Windows XP/VISTA/2000/7/8 over USB or RS-232 serial interface via an RJ-45 Connector provided on the front panel.

Key Features

• Differential Data and Clock Outputs
• Electrical and/or Optical Interfaces
• Preset / Variable data rates
• Trigger output for oscilloscopes

Applications

• Testing of optical transceivers, transponders, linecards, and subsystems
• Testing of opto-electronic components and devices (TOSA, ROSA, lasers, etc…)
• Fibre optic testing (sensitivity, dispersion penalty)
• Testing of Gb/s ICs, electronic modules, subsystems, and systems
• Serial high-speed backplane and board design

TGR-X110
11 Gbps Broadband Trigger Recovery System

The OPTELLENT TGR-X110 is a compact, cost effective trigger recovery system for testing components and systems in R&D and manufacturing environments. The TGR-X110 enables the recovery of a low frequency trigger from the single-ended input data. This enables viewing the complementary data signal on an oscilloscope for eye-diagram analysis and eye-mask testing. It operates between 8.9 and 11.7 Gb/s and submultiples of this frequency range.

Key Features

• Broadband operation
• Electrical and/or Optical Interfaces
• Clock recovery option
• Ideal for eye-diagram/eye-mask analysis

Applications

• Testing of optical transceivers, transponders, linecards, and subsystems
• Testing of opto-electronic components and devices (TOSA, ROSA, lasers, etc…)
• Testing of Gb/s ICs, electronic modules, subsystems, and systems
• Serial high-speed backplane and board design

CDR3200
3.2Gbps Optical & Electrical Clock/Data Recovery System

The OPTELLENT CDR3200 is a cost-effective easy-touse clock-and-data recovery system for testing components and systems in R&D and manufacturing environments. It incorporates a reference frequency source, electrical and optical input ports and clock recovery circuits in one compact module that operates at data rates up to 3.2Gb/s. The CDR3200 is offered with either preset discrete data rates or with a continuously variable data rate (1kHz step size).

Key Features

• Broadband Clock & Data Recovery
• Electrical and Optical interfaces
• Preset / Variable Data rates
• Trigger output for oscilloscopes

Applications

• Production testing of optical transceivers, diplexers/triplexers, and subsystems
• Production testing of Opto-electronic components and devices (P-I-N/APD, ROSA, etc…)
• Fibre optic testing (dispersion penalty, sensitivity)
• Testing of Gb/s ICs, electronic modules, subsystems, and systems